Testability Analysis of Synchronous Sequential Circuits Based on Structural Data

نویسندگان

  • Raghu V. Hudli
  • Sharad C. Seth
چکیده

Bounds on test sequence length can be used as a testability measure. We give a procedure to compute the upper bound on test sequence length for an arbitrary sequential circuit. We prove that the bound is exact for a certain class of circuits. Three design rules are specified to yield circuits with lower test sequence bounds.

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تاریخ انتشار 1989